Standard Test Data Format

Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but now widely used de facto throughout the semiconductor industry.

STDF is a binary format, but can be converted either to an ASCII format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ascii text is non trivial as it involves a detailed comprehension of the Standard Test Data Format (STDF) specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing statistical analysis on a population of tested devices.

My team have been involved for some STDF convertion Project. We success to make other testing datalog such the Verigy Datalog, Advantest Datalog, CRS to convertor to STDF format. As long as the datalog contain the enough information such the site info, soft bin, hard bin and parametric test result, then there will be the possibility to convert to STDF.Currently there are many free tool to analysis STDF and the advantages of this tools are open source and can be develop follow company need.